Void-species nanostructure of chalcogenide glasses studied with FSDP-related XRD

Void-species nanostructure is studied in glassy arsenic selenide g-As2Se3 and sulphide g-As2S3 using X-ray diffraction in respect to the first sharp diffraction peak (FSDP-related XRD) treated within Elliott's void-based model. It is shown that the previously established analytical relationship between the FSDP position Q1 and nanovoid diameter D in the form of Q1=2.3·π/D seems to be close to ones reported by Gaskell [Medium-range structure in glasses and low-Q structure in neutron and X-ray scattering data, J. Non-Cryst. Solids 351 (2005) 1003-1013] and Rachek [X-ray diffraction study of amorphous alloys Al-Ni-Ce-Sc with using Ehrenfest's formula, J. Non-Cryst. Solids 352 (2006) 3781-3786]. Following to this correlation, it is concluded that internal nanostructural voids in chalcogenide glasses are responsible for low-Q structure observed in X-ray scattering.