Advances in crystal analyzers for inelastic X-ray scattering

The realization of spherical crystal analyzers for inelastic X-ray scattering experiments (IXS) is an ongoing project at the ESRF since 1992. We developed reliable techniques to routinely produce silicon spherical analyzers with very high (ΔE=1÷10 meV) and high energy resolution (ΔE=0.2÷1.5 eV), and with very good focal properties and efficiency. In this article we report the state of the art of the analyzer construction and the main improvements made during the last years.