Raman spectroscopic analysis of sulphur-doped TiO2 by co-grinding with TiS2

Doping sulphur into titania has been tried using TiS2 as a doper based on the mechanically induced solid-state reaction between TiO2 and TiS2. The prepared samples have been characterized by X-ray diffraction (XRD), Raman spectroscopy and UV–Vis reflectance spectroscopy. Raman analysis, particularly has been proved to be effective in assessing the sulphur doping by correlating the oxygen deficiency of the doped oxide with the change of active Eg mode of rutile phase.