کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1519135 | 1511621 | 2007 | 7 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Structural characterization of thermally evaporated Bi2Te3 thin films Structural characterization of thermally evaporated Bi2Te3 thin films](/preview/png/1519135.png)
Thermally evaporated Bi2Te3 thin films were deposited on glass substrates. X-ray diffraction study confirmed that the growned films are polycrystalline in nature having hexagonal structure. The film exhibits preferential orientation along the [0 1 5] direction for the films of all thickness together with other abundant planes [0 1 1 1] and [1 1 0]. Various structural parameters such as lattice constants, crystallite size, strain, and dislocation density have been calculated and they are found to be thickness dependent. The lattice parameters are found to be a=4.38 Å and c=30.40 Å. The grain size of the films increases with thickness as the dislocation density and the microstrain decreases with thickness. The mean bond energy and the average coordination number of Bi2Te3 thin film are found to be 1.72 eV and 2.4, respectively.
Journal: Journal of Physics and Chemistry of Solids - Volume 68, Issue 1, January 2007, Pages 111–117