کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1519266 1511624 2006 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray diffraction measurements in a rotational diamond anvil cell
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
X-ray diffraction measurements in a rotational diamond anvil cell
چکیده انگلیسی

We have established an experimental method to perform synchrotron X-ray diffraction in a rotational diamond anvil cell to study the properties of a material under pressure and shear by achieving a quasi-homogeneous pressure distribution. The uniform distribution of pressure eliminates the peak widening caused by pressure deviation in the sample chamber. This enables us to explore the effects of shear on the physical and chemical properties such as the structural disorder, phase transformation, and chemical bonding. The method has been applied in studying the shear-induced stacking fault, phase transition-induced plasticity, and the shear-induced formation of bonding between diamond and hexagonal boron nitride.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Physics and Chemistry of Solids - Volume 67, Issues 9–10, September–October 2006, Pages 2083–2090
نویسندگان
, , ,