کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1521462 | 1511813 | 2015 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Thickness dependent stresses and thermal expansion of epitaxial LiNbO3 thin films on C-sapphire
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Thickness dependent stresses and thermal expansion of epitaxial LiNbO3 thin films on C-sapphire Thickness dependent stresses and thermal expansion of epitaxial LiNbO3 thin films on C-sapphire](/preview/png/1521462.png)
چکیده انگلیسی
LiNbO3 films of high epitaxial quality and with thicknesses of 120-500 nm were deposited at 650 °C on C-sapphire by atmospheric pressure metal-organic chemical vapour deposition. Li nonstoichiometry, residual stresses, twinning, and thermal expansion of the films as a function of the film thickness were investigated by means of Raman spectroscopy and X-ray diffraction. The relaxation of residual stresses, Li2O loss, inelastic deformation and elastic hysteresis during cycles of heating up to 860 °C and cooling down to room temperature were studied, as well. The residual stresses and thermal expansion of films were highly thickness dependent. It was shown that the {011¯2} twinning contributed to the stress relaxation in the thick LiNbO3 films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volumes 149â150, 15 January 2015, Pages 622-631
Journal: Materials Chemistry and Physics - Volumes 149â150, 15 January 2015, Pages 622-631
نویسندگان
A. Bartasyte, V. Plausinaitiene, A. Abrutis, S. Stanionyte, S. Margueron, V. Kubilius, P. Boulet, S. Huband, P.A. Thomas,