کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1522055 | 1511818 | 2014 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Formation and electron field emission of graphene films grown by hot filament chemical vapor deposition
ترجمه فارسی عنوان
فرمولاسیون و انتشار میدان الکترونی از فیلم های گرافن رشد شده توسط رسوبات شیمیایی رشته حرارتی داغ
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
چکیده انگلیسی
Graphene films with different structures were catalytically grown on the silicon substrate pre-deposited with a gold film by hot filament chemical vapor deposition under different conditions, where methane, hydrogen and nitrogen were used as the reactive gases. The morphological and compositional properties of graphene films were studied using advanced instruments including field emission scanning electron microscopy, micro-Raman spectroscopy and X-ray photoelectron spectroscopy. The results indicate that the structure and composition of graphene films are changed with the variation of the growth conditions. According to the theory related to thermodynamics, the formation of graphene films was theoretically analyzed and the results indicate that the formation of graphene films is related to the fast incorporation and precipitation of carbon. The electron field emission (EFE) properties of graphene films were studied in a high vacuum system of â¼10â6 Pa and the EFE results show that the turn-on field is in a range of 5.2-5.64 V μmâ1 and the maximum current density is about 63 μ A cmâ2 at the field of 7.7 V μmâ1. These results are important to control the structure of graphene films and have the potential applications of graphene in various nanodevices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volume 144, Issues 1â2, 14 March 2014, Pages 66-74
Journal: Materials Chemistry and Physics - Volume 144, Issues 1â2, 14 March 2014, Pages 66-74
نویسندگان
B.B. Wang, K. Zheng, Q.J. Cheng, L. Wang, M.P. Zheng, K. Ostrikov,