XPS study of InTe and GaTe single crystals oxidation

Using X-ray photoelectron spectroscopy (XPS) thermal oxidation of indium and gallium tellurides single crystals was studied. It was established, that oxidation produces layers of both metal and tellurium oxides on the surface, which drastically differs from indium and gallium sulphides and selenides own oxides. Possibility of formation of the other tellurium containing phases is discussed.