Near-field study with a photon scanning tunneling microscope: Comparison between dielectric nanostructure and metallic nanostructure

Scanning near-field optical microscopy (SNOM) integrates standard optical methods with scanning probe microscopy (SPM) techniques allowing to collect optical information with resolution well beyond the diffraction limit. We study the influence on image formation of several parameters in scanning near-field microscopy. The numerical calculations have been carried out using the differential method. We investigate a 2D-PSTM configuration with a dielectric rectangular object. We will focus on the collection type SNOM in a constant height scanning mode. Various oscillation patterns are observed from both sides of the nanostructure, which we interpret as interference between the diffracted waves scattered by the nanostructure (with the components of the wave vector parallel to the surface) and the evanescent incident wave above the surface. Using an optical near-field analysis and by calculating the electric field intensity distribution, we investigate the probe–sample distance effect. It is found that the distribution of the intensity related to the electric field is depending on sample–probe distance. We noticed the loss of details in the image and the presence of dramatic oscillations. Also, both of the polarization state of the illuminating light effect and the angle of incidence are investigated. We conclude that a differential method provides physical insight into the main features of the different images.