Pareto analysis of critical challenges for emerging manufacturing technologies in silicon photovoltaics

• A Pareto analysis of challenges for emerging c-Si technologies has been conducted.
• Six sub-categories were used, three in processing and three in metrology.
• 14 critical challenges were identified out of a total of 64 challenges.
• A brief literature review of each of the 14 critical challenges is included.
• The Cell Materials and Processing sub-category featured the most critical challenges.

This work presents the results of a Pareto analysis of critical challenges for emerging manufacturing technologies in c-Si photovoltaics. By soliciting input from members of the PV R&D community, these challenges have been prioritized for six different sub-categories, the first three associated with Processing Challenges and the following three in the area of Metrology Challenges: (1) Feedstock, Crystallization and Wafering; (2) Cell Materials and Processing; (3) Module Integration; (4) Materials and Device Characterization; (5) Reliability and Durability (Measurements); and (6) Modeling and Simulation. Some sub-categories feature a large differential in scoring from the top challenge(s) to lower scored challenges (e.g. Module Integration, Modeling and Simulation), indicating topics of high interest. Other sub-categories feature a more evenly distributed level of prioritization (e.g. Cell Materials and Processing), indicating many high priority challenges within the same area. In total, 14 top critical challenges were identified for the six sub-categories, and a brief review for each of these is provided. As industry and academia seek R&D topics to help push for higher efficiencies and lower cost c-Si modules, this Pareto analysis can hopefully provide some objective insight into areas of high interest for the general PV community.