کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1555711 | 999114 | 2006 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Studying spintronics materials with soft X-ray resonant scattering
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
شیمی مواد
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Soft X-ray resonant magnetic scattering offers a unique element-, site- and valence-specific probe to study magnetic structures on a length scale from 1 to 1000Â nm. This new technique, which combines X-ray scattering with X-ray magnetic circular and linear dichroism, is ideally suited to investigate magnetic superlattices and magnetic stripe domains. Recent results that are presented here include element-specific magnetic studies on interfaces, thin films, magnetic multilayers, self-organising magnetic domain structures, magnetic layer profiles, patterned samples, and magnetic nanoobjects using coherent X-rays. Soft X-ray diffraction to study the interplay between charge, spin and orbital ordering in correlated 3d transition metal systems, such as manganites, is also discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Opinion in Solid State and Materials Science - Volume 10, Issue 2, April 2006, Pages 120-127
Journal: Current Opinion in Solid State and Materials Science - Volume 10, Issue 2, April 2006, Pages 120-127
نویسندگان
Gerrit van der Laan,