Multiscale microstructural characterization of Sn-rich alloys by three dimensional (3D) X-ray synchrotron tomography and focused ion beam (FIB) tomography

► Multiscale characterization by X-ray synchrotron and focused ion beam tomography. ► Characterized microstructural features in several Sn-based alloys. ► Quantified size, fraction, and clustering of microstructural features.