کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1572276 1000676 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Correlations between mechanical stress, electrical conductivity and nanostructure in Al films on a polymer substrate
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Correlations between mechanical stress, electrical conductivity and nanostructure in Al films on a polymer substrate
چکیده انگلیسی

The relation between mechanical stress, electrical resistivity and film nanostructure is investigated here for 100 nm thick aluminum films deposited on micrometer-thick polysulfone. It is observed that film electrical resistivity increases significantly before mechanical failure occurs, because of the formation of micro-cracks on the film surface. The applied tensile stress also influences the film nanostructure in an irreversible manner, causing plastic rearrangement of the film grains well before macroscopic failure occurs, which suggests stress-assisted grain growth at the nanostructural level.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Characterization - Volume 61, Issue 3, March 2010, Pages 325–329
نویسندگان
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