کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1572711 1000698 2006 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Quantitative WDS analysis using electron probe microanalyzer
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
Quantitative WDS analysis using electron probe microanalyzer
چکیده انگلیسی

In this paper, the procedure for conducting quantitative elemental analysis by ZAF correction method using wavelength dispersive X-ray spectroscopy (WDS) in an electron probe microanalyzer (EPMA) is elaborated. Analysis of a thermal barrier coating (TBC) system formed on a Ni-based single crystal superalloy is presented as an example to illustrate the analysis of samples consisting of a large number of major and minor elements. The analysis was performed by known standards and measured peak-to-background intensity ratios. The procedure for using separate set of acquisition conditions for major and minor element analysis is explained and its importance is stressed.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Characterization - Volume 56, Issue 3, April 2006, Pages 192–199
نویسندگان
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