کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1572832 | 1000704 | 2006 | 9 صفحه PDF | دانلود رایگان |
The purpose of this paper is to present a method based on the correlation of digital images obtained on a microscopic scale. A specific grainy pattern has been developed. The use of the scanning electron microscopy (SEM) allowed the determination of full-field 2D displacements on an object surface with a spatial resolution of about 1 μm. Validation tests were performed in order to quantify performances and limits of this method. An example of its application is presented for a Ti–6Al–4V titanium alloy. Results show that it is possible to obtain in-plane displacement values on the object surface with efficient spatial resolution and accuracy. Thus, such a technique can be used to highlight on a relevant scale the role of the microstructure in material deformation processes.
Journal: Materials Characterization - Volume 56, Issue 1, January 2006, Pages 10–18