کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1580886 | 1645416 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A superbend X-ray microdiffraction beamline at the advanced light source
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Beamline 12.3.2 at the Advanced Light Source (ALS) is a newly commissioned beamline dedicated to X-ray microdiffraction. It operates in both monochromatic and polychromatic radiation mode. The facility uses a superconducting bending magnet source to deliver an X-ray spectrum ranging from 5 to 22 keV. The beam is focused down to ∼1 μm size at the sample position using a pair of elliptically bent Kirkpatrick–Baez (KB) mirrors enclosed in a vacuum box. The sample placed on high precision stages can be raster-scanned under the microbeam while a diffraction pattern is taken at each step. The arrays of diffraction patterns are then analyzed to derive distribution maps of phases, strain/stress and/or plastic deformation inside the sample.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: A - Volume 524, Issues 1–2, 25 October 2009, Pages 28–32
Journal: Materials Science and Engineering: A - Volume 524, Issues 1–2, 25 October 2009, Pages 28–32
نویسندگان
N. Tamura, M. Kunz, K. Chen, R.S. Celestre, A.A. MacDowell, T. Warwick,