Relaxation of magnetization in thin composite (Co45Fe45Zr10)X(Al2O3)100−X films

This paper examines the specific electric resistance, magnetization, porosity, demagnetizing fields, and relaxation magnetization frequencies in composite (Co45Fe45Zr10)X(Al2O3)100−X films. A strong correlation between the ferromagnetic resonances (FMR) line width, the relaxation frequency, and specific resistance are observed. The FMR line shape for films with a small percentage of the metal phase transforms from a resonant line shape to a relaxation line shape as the temperature decreases or the film is annealed. This transition is connected to the changes in the metal–dielectric boundary properties.