کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1586077 | 1514928 | 2006 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Annealing behavior of Zr702 fabricated by ECAP Annealing behavior of Zr702 fabricated by ECAP](/preview/png/1586077.png)
The annealing behavior in Zr702 processed by equal channel angular pressing (ECAP) was investigated. ECAP was carried out at room temperature with the sample rotated 90 ° in the same sense in each pass. The annealing of ECAP’ed Zr702 was performed at the temperature of above recrystallization. The four passes developed deformation twins and a high dislocation density in grains exhibits. Full recrystallization occurred with annealing at 873 K for 10 min with a recrystallized grain size of ∼ 3 μm. The kinetics of grain growth of ECAP’ed Zr702 was analyzed by the non-ideal grain growth law. The grain growth exponents of Zr702 at temperatures of 873, 973 and 1073 K were 0.12, 0.24 and 0.24, respectively. The activation energy for grain growth was 134 kJ mol−1.
Journal: Materials Science and Engineering: A - Volume 416, Issues 1–2, 25 January 2006, Pages 150–154