کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1590808 | 1515467 | 2007 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Observation of nanostructure by scanning near-field optical microscope with small sphere probe
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Observation of nanostructure by scanning near-field optical microscope with small sphere probe Observation of nanostructure by scanning near-field optical microscope with small sphere probe](/preview/png/1590808.png)
چکیده انگلیسی
Step and terrace structure has been observed in an area of 1 μmÃ1 μm on the cleaved surface of KCl-KBr solid-solution single crystal by scanning near-field optical microscope (SNOM) with a small sphere probe of 500 nm diameter. Lateral spatial resolution of the SNOM system was estimated to be 20 nm from the observation of step width and the scanning-step interval. Vertical spatial resolution was estimated to be 5-2 nm from the observation of step height and noise level of photomultiplier tube (PMT). With applying a dielectric dipole radiation model to the probe surface, the reason why such a high spatial resolution was obtained in spite of the 500 nm sphere probe, was understood as the effect of the near-field term appeared in the radiation field equations.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Science and Technology of Advanced Materials - Volume 8, Issue 3, April 2007, Pages 181-185
Journal: Science and Technology of Advanced Materials - Volume 8, Issue 3, April 2007, Pages 181-185
نویسندگان
Yasushi Oshikane, Toshihiko Kataoka, Mitsuru Okuda, Seiji Hara, Haruyuki Inoue, Motohiro Nakano,