کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1590904 | 1515470 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy](/preview/png/1590904.png)
چکیده انگلیسی
When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al-Si alloy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Science and Technology of Advanced Materials - Volume 7, Issue 7, October 2006, Pages 726-731
Journal: Science and Technology of Advanced Materials - Volume 7, Issue 7, October 2006, Pages 726-731
نویسندگان
Kenji Kaneko, Ryo Nagayama, Koji Inoke, Etsuko Noguchi, Zenji Horita,