کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1595756 1002790 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa
چکیده انگلیسی
Microstructure of MnF2 subjected to by shock compression at 4.4 GPa was examined using transmission electron microscopy (TEM). Lamellar structure consisting of twin-related domains of rutile-structure and intergrowth of α- PbO2-type phase is observed in the electron diffraction pattern and TEM images. The crystallographic relationship between rutile and α- PbO2-type phases can be expressed as (1̄01)rutile∥(001)α-PbO2 and [111]rutile∥[110]α-PbO2.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Communications - Volume 143, Issue 3, July 2007, Pages 127-130
نویسندگان
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