Tuning of electron transport through a moebius strip: Shot noise

We study electron transport through a moebius strip attached to two metallic electrodes by the use of a Green’s function technique. A parametric approach is used based on the tight-binding model to characterize the electron transport through such a bridge system and it is observed that the transport properties are significantly affected by (a) the transverse hopping strength between the two channels and (b) the strip-to-electrodes coupling strength. In this context we also describe the noise power of the current fluctuations, which provide key information about the electron correlation which is obtained by calculating the Fano factor (FF). The knowledge of these current fluctuations gives important ideas for the fabrication of efficient molecular devices.