کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1600811 | 1005176 | 2010 | 10 صفحه PDF | دانلود رایگان |
The formation of B2-RuAl from Ru/Al multilayers (MLs) with an average MLs composition of Ru47Al53 and modulation periods Λ up to 22.4 nm was studied by in-situ X-ray diffraction (XRD), differential scanning calorimetry, scanning electron microscopy and transmission electron microscopy. The as-deposited MLs with Λ < 4.5 nm grow epitaxially with relatively small roughness of the atomic layers. At higher Λ values, the epitaxy is lost and polycrystalline MLs with strongly distorted atomic layers develop during deposition. In-situ high-temperature XRD demonstrated that Λ influences the phase evolution and kinetics during annealing. At annealing temperatures TA < 673 K Al diffuses into the Ru layers leading to the formation first of Ru(Al) solid solution. At TA > 823 K the ordered B2-RuAl phase is formed via a diffusion-controlled nucleation. The RuAl grain growth kinetics accelerates with increasing Λ.
Journal: Intermetallics - Volume 18, Issue 8, August 2010, Pages 1507–1516