Investigation of normal recrystallization and abnormal recrystallization in pure tungsten sheet by EBSD

Normal recrystallization and abnormal recrystallization induced by Ni in pure tungsten (W) sheet were studied by EBSD. It was demonstrated that (001)[11¯0] and (111)[11¯0] textures in the deformed W sheet remain after normal recrystallization, but with lower densities. In addition, (001)[01¯0] and (111)[1¯1¯2] textures arise after recrystallization, which can be explained on the subgrain coarsening recrystallization mechanism. During the abnormal recrystallization of W sheets, grain boundary phase change occurred first between Ni and W, which leads to the formation of liquid-like films on grain boundaries. The occurrence of grain boundary phase change depends mainly on the grain boundary misorientation angle. Grain boundaries with liquid-like film will migrate under the driving force of eliminating deformation storage energy, which gives rise to abnormal recrystallization in W sheets. After abnormal recrystallization, (001)[11¯0] and (111)[11¯0] textures disappeared, leaving only weak texture near (001)[01¯0].

Figure (a) and (b) is the φ2 = 45° ODF section of W sheet after normal recrystallization and abnormal recrystallization, respectively. It can be seen that not only the texture density but also the texture components are different in the two recrystallized W sheets.Figure optionsDownload as PowerPoint slide