Strain and stress analysis on Zn multicrystal film by XRD method

A new method was denonstrated to determine stress in a single crystal for multicrystal material and this new method could be specially applied for any symmetric crystalline systems. The strain tensor ɛ was determined by the change of the metric tensor G before the initial state and after the deformed state in the crystal reference system. Then stress tensor at grain scale was calculated by the HOOK's law. The stress evaluations were carried out in coarse grains of a thin galvanized coating on a steel substrate during tensile loading. This makes it possible to link the microstructure evolution to the elastic heterogeneity at grain scale or between the grains.