کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1680167 1518657 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Wavelength dispersive μPIXE setup for the ion microprobe
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Wavelength dispersive μPIXE setup for the ion microprobe
چکیده انگلیسی

We have developed a small wavelength dispersive X-ray spectrometer to explore the possibility of performing chemical speciation on microscopic samples utilizing focused ion beams available at the Rudjer Boskovic Institute ion microprobe. Although PIXE spectra are in principle chemically invariant, small influence of chemical effects could be observed even with Si(Li) or SDD detectors. Such chemical effects can be clearly seen with high resolution crystal X-ray spectrometers having energy resolution of several eV. A dedicated vacuum chamber, housing the diffraction crystal, sample holder and CCD X-ray detector, was constructed and positioned behind the main ion microprobe vacuum chamber. Here we will briefly describe the spectrometer, and illustrate its capabilities on measured K X-ray spectra of selected sulfur compounds. We will also demonstrate its abilities to resolve K and M X-ray lines irresolvable by solid state ED detectors usually used in PIXE.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 363, 15 November 2015, Pages 61–65
نویسندگان
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