کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1680345 1518671 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Resolution considerations in MeV ion microscopy and lithography
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Resolution considerations in MeV ion microscopy and lithography
چکیده انگلیسی

There a disparity between the way the resolution is specified in microscopy and lithography using light compared to MeV ion microscopy and lithography. In this work we explore the implications of the way the resolution is defined with a view to answering the questions; how are the resolving powers in MeV ion microscopy and lithography relate to their optical counterparts? and how do different forms of point spread function affect the modulation transfer function and the sharpness of the edge profile?

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 348, 1 April 2015, Pages 53–57
نویسندگان
, ,