کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1680432 | 1518672 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Quantification estimate methods for synchrotron radiation X-ray fluorescence spectroscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Quantification estimate methods for synchrotron radiation X-ray fluorescence spectroscopy Quantification estimate methods for synchrotron radiation X-ray fluorescence spectroscopy](/preview/png/1680432.png)
چکیده انگلیسی
Synchrotron radiation X-ray fluorescence spectroscopy is a method which allows low elemental concentrations to be measured within a sample. To maintain biological or medical relevance increased importance is being placed on quantifying these in situ localized elemental concentrations. For third generation synchrotron light sources, which have the potential for high sample throughput, a rapid method of obtaining a quantification estimate is needed. Non-destructive transmission and surface analysis techniques for first transition metals, or elements of higher atomic number, using reference standards are examined for different sample property regimes to elucidate methods of quantitative synchrotron radiation X-ray fluorescence spectroscopy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 347, 15 March 2015, Pages 1–6
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 347, 15 March 2015, Pages 1–6
نویسندگان
Brian Bewer,