کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1681052 1518693 2014 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A novel ion-beam-mutation effect application in identification of gene involved in bacterial antagonism to fungal infection of ornamental crops
ترجمه فارسی عنوان
کاربرد جدید اثر جهش یونی برش در شناسایی ژن درگیر در انطباق باکتریایی با عفونت قارچی محصولات زراعی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
چکیده انگلیسی


• Ion beam bombardment induced mutation in bacterial B. licheniformis.
• A mutant lost antifungal activity.
• DNA fingerprint of the mutant was analyzed.
• The lost gene was indentified to code for TrxR gene.
• TrxR gene from B. licheniformis expressed the flower antagonism to fungi.

This work is on a novel application of ion beam effect on biological mutation. Bacillus licheniformis (B. licheniformis) is a common soil bacterium with an antagonistic effect on Curcuma alismatifolia Gagnep. and Chrysanthemum indicum Linn. In an attempt to control fungal diseases of local crops by utilizing B. licheniformis, we carried out gene analysis of the bacterium to understand the bacterial antagonistic mechanism. The bacterial cells were bombarded to induce mutations using nitrogen ion beam. After ion bombardment, DNA analysis revealed that the modified polymorphism fragment present in the wild type was missing in a bacterial mutant which lost the antifungal activity. The fragments conserved in the wild type but lost in the mutant bacteria was identified to code for the thioredoxin reductase (TrxR) gene. The gene analysis showed that the TrxR gene from B. licheniformis had the expression of the antagonism to fungi in a synchronous time evolution with the fungus inhibition when the bacteria were co-cultivated with the fungi. The collective results indicate the TrxR gene responsible for the antagonism of bacteria B. licheniformis to fungal infection.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 326, 1 May 2014, Pages 209–213
نویسندگان
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