کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1681061 | 1518693 | 2014 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Multi-scale X-ray diffraction study of strains induced by He implantation in UO2 polycrystals
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Mechanical behaviour of 60 keV He implanted UO2 polycrystals has been analysed at a macroscopic scale using X-ray diffraction techniques (conventional θ/θ mode and sin2ψ method). The free swelling in the implanted layer has been determined at low damage levels (below 1 dpa) i.e. in a strain regime where the UO2 crystal structure deforms elastically. The obtained results are in excellent agreement with previous measurements performed at the micrometre (grain) scale using Laue X-ray diffraction. Finally it is shown that evolutions of free swelling with damage level in implanted polycrystals and in self-irradiated (U, 238Pu)O2 pellets are similar.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 326, 1 May 2014, Pages 251–255
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 326, 1 May 2014, Pages 251–255
نویسندگان
A. Richard, E. Castelier, H. Palancher, J.S. Micha, H. Rouquette, A. Ambard, Ph. Garcia, Ph. Goudeau,