First tests of the ion irradiation and implantation beamline at the CMAM

The implantation and irradiation beamline of the Tandem ion accelerator of the Centro de Micro Análisis de Materiales (CMAM), in Madrid, has been recently completed with a beam sweep and monitoring system, and a cryostat/furnace. These new implementations convert the beamline into a versatile tool to implant ions, between H and Au2, in different materials with precise control of the sample temperature, which may be varied between −180 °C and 600 °C. The size of the swept area on target may be as large as 10  × 10 cm2. The implantation chamber also allows carrying out in situ or/and on line analyses during the irradiations by means of advanced optical measurements, as well as ion beam analyses (IBA). These advancements can be employed in novel applications such as the fabrication of optical waveguides and irradiation tests of structural and functional materials for future fusion reactors. The results of beam tests and first experiments are shown.