کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1681284 | 1518712 | 2013 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The progress of X-ray fluorescence computed tomography at SSRF
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: The progress of X-ray fluorescence computed tomography at SSRF The progress of X-ray fluorescence computed tomography at SSRF](/preview/png/1681284.png)
چکیده انگلیسی
X-ray fluorescence computed tomography is a stimulated emission tomography that allows nondestructive reconstruction of elements distribution in the sample and has been applied in many fields. Since 2007 we have developed X-ray fluorescence tomography for microanalysis. In 2010, the system was established at the Shanghai Synchrotron Radiation Facility (SSRF) and preliminary experimental results were obtained at the X-ray imaging (BL13W1) and hard X-ray micro-focusing beamline (BL15U1). Recently, an ordered-subsets expectation maximization algorithm has been introduced to speed up the data acquisition process. We are now studying accelerating X-ray fluorescence computed tomography based fast scanning and the new algorithm.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 305, 15 June 2013, Pages 5–8
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 305, 15 June 2013, Pages 5–8
نویسندگان
Biao Deng, Qun Yang, Guohao Du, Yajun Tong, Honglan Xie, Tiqiao Xiao,