کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1681354 1010437 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effect of inter-atomic Auger processes on relaxation of electronic vacancies at deep levels of highly ionized atoms in swift heavy ion tracks
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Effect of inter-atomic Auger processes on relaxation of electronic vacancies at deep levels of highly ionized atoms in swift heavy ion tracks
چکیده انگلیسی

We present the results of Monte-Carlo simulations of excitation and subsequent relaxation of the electronic subsystem of quartz in the close vicinity of the swift heavy ion (SHI) trajectory. Comparison between numerical results and experiments detecting X-ray K-shell emission of silicon atoms (KαLn transitions) from quartz aerogel irradiated with SHIs demonstrated that the adequate description of the relaxation kinetics of the excited electronic subsystem of a solid in a SHI track cannot be possible without taking into account fast inter-atomic Auger processes which are absent in gaseous targets.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issue 19, 1 October 2010, Pages 2870–2873
نویسندگان
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