کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1681354 | 1010437 | 2010 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effect of inter-atomic Auger processes on relaxation of electronic vacancies at deep levels of highly ionized atoms in swift heavy ion tracks
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
We present the results of Monte-Carlo simulations of excitation and subsequent relaxation of the electronic subsystem of quartz in the close vicinity of the swift heavy ion (SHI) trajectory. Comparison between numerical results and experiments detecting X-ray K-shell emission of silicon atoms (KαLn transitions) from quartz aerogel irradiated with SHIs demonstrated that the adequate description of the relaxation kinetics of the excited electronic subsystem of a solid in a SHI track cannot be possible without taking into account fast inter-atomic Auger processes which are absent in gaseous targets.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issue 19, 1 October 2010, Pages 2870–2873
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issue 19, 1 October 2010, Pages 2870–2873
نویسندگان
N.A. Medvedev, A.E. Volkov, B. Rethfeld, N.S. Shcheblanov,