Monte Carlo calculations of characteristic quantities of low-energy electron irradiation to spacecraft dielectrics

The calculations of the characteristic quantities of low-energy electron (⩽20 keV) irradiation to the five typical spacecraft dielectrics, i.e. epoxy, kapton, mylar, polyethylene, and teflon, have been performed by means of Monte Carlo method. These characteristic quantities include the electron backscattering coefficient, the depth distributions of both energy deposition and deposited electrons, and the maximum penetration depth of deposited electrons in the dielectrics. A Monte Carlo model has been specifically constructed for simulating the transport of low-energy electrons in spacecraft dielectrics (organic materials). In this model, the description of the inelastic scattering of energetic electron is based on the dielectric approach developed previously and the Born–Ochkur’s exchange correction is included. Especially, the optical energy loss functions of organic materials can be obtained using an empirical evaluation. In addition, the mean cross section based on the Mott model is proposed for calculating the elastic scattering of energetic electrons in organic materials for high simulation efficiency. The constructed Monte Carlo model has been examined by a series of calculations and comparisons with the reported experiments and other theoretical results. For the dielectrics under consideration and in the energy range of E0 ⩽ 20 keV, the calculated electron backscattering coefficients and the extrapolated range of deposited electrons are listed at selected energies in numerical form for convenient use, and an empirical expression of estimating the extrapolated range in the energy range of 1–20 keV is given. The distribution characteristics of both energy deposition and deposited electrons are presented, and it is found that kapton and mylar present the close characteristic quantities for each other, which is of significance for the choice of the dielectrics in design of spacecraft. The characteristic quantity calculations presented in this work are a first attempt and may be useful for studies of the surface charging and the internal dielectric charging on spacecraft.