کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1682239 1518730 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Synthesis and characterisation of ion-implanted epoxy composites for X-ray shielding
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Synthesis and characterisation of ion-implanted epoxy composites for X-ray shielding
چکیده انگلیسی

The epoxy samples were implanted with heavy ions such as tungsten (W), gold (Au) and lead (Pb) to investigate the attenuation characteristics of these composites. Near-surface composition depth profiling of ion-implanted epoxy systems was studied using Rutherford Backscattering Spectroscopy (RBS). The effect of implanted ions on the X-ray attenuation was studied with a general diagnostic X-ray machine with X-ray tube voltages from 40 to 100 kV at constant exposure 10 mAs. Results show that the threshold of implanted ions above which X-ray mass attenuation coefficient, μm of the ion-implanted epoxy composite is distinguishably higher than the μm of the pure epoxy sample is different for W, Au and Pb.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 287, 15 September 2012, Pages 120–123
نویسندگان
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