کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1682322 | 1518744 | 2012 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Three dimensional nanostructures fabricated by electron beam (EB) induced deposition were measured by time of flight (TOF) Rutherford backscattering spectrometry (RBS) for checking the spatial resolution of a three dimensional analysis. Pt peaks in TOF-RBS spectra for Pt stripes under a SiO2 layer on a Si substrate samples were slightly shifted to slower position with increasing the thicknesses of the SiO2 layer. The atomic thicknesses for SiO2 fabricated by EB induced deposition measured by TOF-RBS were approximately 25% of the physical thicknesses obtained by a scanning electron microscope. Because SiO2 fabricated by EB induced deposition was not a pure SiO2 layer. The depth resolution in the three dimensional analysis with the TOF-RBS was approximately 10Â nm for SiO2 layer. Embedded Ga stripes under a SiO2 layer and Pt stripes on a Si substrate were observed by TOF-RBS. The in-plane resolution under the SiO2 layer was at least less than 70Â nm in the three dimensional analysis with the TOF-RBS.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 273, 15 February 2012, Pages 266-269
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 273, 15 February 2012, Pages 266-269
نویسندگان
Satoshi Abo, Takayuki Azuma, Tivadar Lohner, Fujio Wakaya, Mikio Takai,