کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1682623 | 1518742 | 2012 | 17 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Isotopic fractionation of silicon negative ions sputtered from minerals by Cs+ bombardment
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Negative silicon ions sputtered from a set of olivines under Cs bombardment show useful yield UY variations depending on sample compositions. Those matrix effects are correlated with atomic concentrations of implanted cesium close to surface, which in turn depend on sputtering yields. It is shown that instrumental mass fractionations IMF on isotopes are depending on UY. A linear relationship between IMF and the inverse of Af, the Cs atomic fraction, is experimentally established for Si as well as a linear dependence of UY on Af. A model linking the two sets of experimental data is proposed. Measurement artefacts are reviewed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 275, 15 March 2012, Pages 41–57
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 275, 15 March 2012, Pages 41–57
نویسندگان
G. Slodzian, C. Engrand, J. Duprat,