کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1682996 | 1010488 | 2011 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Chemical speciation of chlorine in particulate matter by wavelength-dispersive PIXE technique
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Chemical speciation of chlorine (Cl) in atmospheric particulate matter (APM) was performed by using a wavelength-dispersive PIXE spectrograph based on high-resolution measurement of Cl-Kβ emission. Samples of atmospheric particles were size-fractioned and collected by a cascade impactor at an urban area in Tokyo. The target position with respect to the spectrograph was precisely adjusted by a 2D laser displacement sensor to achieve high detection efficiency. The samples were irradiated with 2 MeV protons from a tandem electrostatic accelerator. The beam current was 300-500 nA. During the irradiation, the target was cooled by liquid nitrogen to avoid the evaporation of volatile Cl compounds. The measured spectra for the NaCl standard samples clearly showed the Cl-Kβ series composed of the Kβ1 and the satellite Kβx, Kβ5 lines. From the measured X-ray yields, it was found that the chemical speciation of samples with Cl concentrations as low as â1% is possible by this method. The Cl-Kβ series were also successfully observed in the case of APM samples with particle sizes of 11.0-2.1 μm. The spectra shapes of the NaCl standard samples and an APM sample were slightly different from each other, because of some possible mixing of non-sea salt component in the APM sample.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 269, Issue 24, 15 December 2011, Pages 3111-3114
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 269, Issue 24, 15 December 2011, Pages 3111-3114
نویسندگان
Sarinrat Wonglee, Tsutomu Tada, Hitoshi Fukuda, Jun Hasegawa, Yoshiyuki Oguri,