کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1683759 1518751 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
XPS characterization of different thermal treatments in the ITO–Si interface of a carbonate-textured monocrystalline silicon solar cell
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
XPS characterization of different thermal treatments in the ITO–Si interface of a carbonate-textured monocrystalline silicon solar cell
چکیده انگلیسی

In this work we have applied the X-ray photoelectron spectroscopy (XPS) in depth to study, for the first time, the influence of different thermal treatments in the ITO–Si interface of a monocrystalline Si-based solar cell where the Si surface is carbonate-textured and covered by an ITO sputtered layer. The efficiency of the solar cells significantly increases when thermal treatments are applied just after the ITO deposition. The efficiency is also dependent on the characteristics of the pyramidal relief of the silicon surface previously obtained by immersion of the Si wafers in a sodium carbonate/bicarbonate solution. An efficiency of 15.5% has been obtained with an optimized texturization of the silicon substrates and an annealing treatment of the solar cells at 400 °C just after the ITO deposition.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issues 3–4, February 2010, Pages 374–378
نویسندگان
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