کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1684181 | 1010524 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
X-ray characterization of surfaces irradiated with highly charged ions
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: X-ray characterization of surfaces irradiated with highly charged ions X-ray characterization of surfaces irradiated with highly charged ions](/preview/png/1684181.png)
چکیده انگلیسی
Highly charged ions (HCI) approaching, touching or penetrating dielectric surfaces extract many electrons of the solid leading to the formation of permanent surface modifications. The ions which capture the electrons in their outermost shells form hollow atoms which emit X-rays during their decay to the ground state. In this paper one presents experiments showing that these X-rays) allow diagnosing the electric nature of the surfaces. HCI while modifying the structure of surfaces may then also be used to diagnose these changes on line or off line.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 267, Issue 4, February 2009, Pages 665–668
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 267, Issue 4, February 2009, Pages 665–668
نویسندگان
J.P. Briand, M. Benhachoum,