کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1684222 | 1518749 | 2010 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Simulation of L X-ray yields induced by He ions
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
The PIXE simulation open-source library, LibCPIXE [1], publicly released, allows the simulation of X-ray yields of PIXE spectra taken from arbitrary samples irradiated with proton beams, including multilayered targets. Nevertheless, IBA analysis of many systems of interest to material sciences and other applications frequently require the quantification of He ions induced X-ray yields. LibCPIXE was thus adapted to this requirement. In this work, simulated intensities of the L lines are compared to the experimental results from W compound samples irradiated with He2+ ion beams [2]. Problems overcome or faced during this extension to He beams, including fundamental parameters details on the database and approximations used, are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issues 11–12, June 2010, Pages 1802–1805
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issues 11–12, June 2010, Pages 1802–1805
نویسندگان
A. Taborda, P.C. Chaves, M.A. Reis,