Simulation of L X-ray yields induced by He ions

The PIXE simulation open-source library, LibCPIXE [1], publicly released, allows the simulation of X-ray yields of PIXE spectra taken from arbitrary samples irradiated with proton beams, including multilayered targets. Nevertheless, IBA analysis of many systems of interest to material sciences and other applications frequently require the quantification of He ions induced X-ray yields. LibCPIXE was thus adapted to this requirement. In this work, simulated intensities of the L lines are compared to the experimental results from W compound samples irradiated with He2+ ion beams [2]. Problems overcome or faced during this extension to He beams, including fundamental parameters details on the database and approximations used, are discussed.