کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1684275 1518749 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Contribution of ion beam analysis methods to the development of second generation high temperature superconducting wires
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Contribution of ion beam analysis methods to the development of second generation high temperature superconducting wires
چکیده انگلیسی

One of the crucial steps in the second generation high temperature superconducting wire program was development of the buffer-layer architecture. The architecture designed at the Superconductivity Technology Center at Los Alamos National Laboratory consists of several oxide layers wherein each layer plays a specific role, namely: nucleation layer, diffusion barrier, biaxially textured template, and intermediate layer providing a suitable lattice match to the superconducting Y1Ba2Cu3O7 (YBCO) compound. This report demonstrates how a wide range of ion beam analysis techniques (SIMS, RBS, channeling, PIXE, PIGE, NRA and ERD) was employed for analysis of each buffer layer and the YBCO film. These results assisted in understanding of a variety of physical processes occurring during the buffer layer fabrication and helped to optimize the buffer-layer architecture as a whole.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issues 11–12, June 2010, Pages 2046–2050
نویسندگان
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