Determination of alpha-particle track depths in CR-39 detector from their cross-sections and replica heights

A challenging task in the application of solid-state nuclear track detectors (SSNTDs) is the measurement of depths of the tracks. One approach involves breaking and polishing the side of SSNTDs to reveal the cross-sections of the tracks for direct measurements. Recently, surface profilometry was used to measure the heights of the replicas of alpha-particle tracks to give the track depths. In the present work, systematic comparisons among the track depths for alpha-particles with normal incidence and different incident energies were made for these two methods. After irradiation, the detectors were etched in a 6.25 N aqueous solution of NaOH at 70 °C. Both long etching time of 15 h (to produce spherical-phase tracks) and short etching time from 1 to 8 h (to produce sharp-phase tracks) were used. Good agreement was achieved between the two methods for spherical-phase tracks but not for sharp-phase tracks. It has been found that the surface profilometry method only works for replicas for spherical-phase tracks. Replicas for sharp-phase tracks are easier to collapse or deform, so the surface profilometry method may not give correct results.