کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1684740 1518760 2007 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Formation and characterization of nanoparticles formed by sequential ion implantation of Au and Co into SiO2
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Formation and characterization of nanoparticles formed by sequential ion implantation of Au and Co into SiO2
چکیده انگلیسی
Nanoparticles (NPs) were formed by sequential ion implantation of Au and Co into thin SiO2. After Au implantation and annealing, Co implantations were carried out at room temperature (RT) and 400 °C, respectively, with no subsequent annealing. The NPs were investigated by means of Rutherford backscattering spectroscopy (RBS), transmission electron microscopy (TEM) and extended X-ray absorption fine structure spectroscopy (EXAFS). TEM shows the formation of Co-Au core-shell NPs for the Co implantation at 400 °C. EXAFS measurements indicate significant strain in the NPs and a bond-length expansion of the Co-Co bonds in the NP core with a concomitant contraction of the Au-Au bonds in the Au shells. NPs are also observed by TEM for the Co implantation performed at RT, however, a lack of crystallinity is apparent from electron diffraction and EXAFS measurements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 257, Issues 1–2, April 2007, Pages 80-84
نویسندگان
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