کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1684977 | 1010541 | 2007 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals](/preview/png/1684977.png)
چکیده انگلیسی
Single crystals of CaF2 and LaF3 were exposed to 30-MeV C60 clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 256, Issue 1, March 2007, Pages 313–318
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 256, Issue 1, March 2007, Pages 313–318
نویسندگان
A.S. El-Said, F. Aumayr, S. Della-Negra, R. Neumann, K. Schwartz, M. Toulemonde, C. Trautmann, K.-O. Voss,