کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1685048 | 1010544 | 2008 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
White beam synchrotron topography using a high resolution digital X-ray imaging detector
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
X-ray topography is a well known imaging technique to characterise strain and extended defects in single crystals. Topographs are typically collected on X-ray films. On the one hand such photographic films show a limited dynamic range and the production of films will be discontinued step by step in the near future. On the other hand new imaging detectors improved for X-ray tomography become more and more attractive even for topography because of increasing resolution, dynamic range, speed and active area. In this paper we report about the upgrade of the TOPO–TOMO beamline at the synchrotron light source ANKA, Research Centre Karlsruhe, with a high resolution digital camera for the topography use.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 266, Issue 9, May 2008, Pages 2035–2040
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 266, Issue 9, May 2008, Pages 2035–2040
نویسندگان
A.N. Danilewsky, A. Rack, J. Wittge, T. Weitkamp, R. Simon, H. Riesemeier, T. Baumbach,