کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1686402 | 1010598 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effect of crystallinity on the memory effect of Ge nanocrystals synthesized by atom beam sputtering
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
The effect of crystallinity of Ge nanocrystals on the charge storage properties of the metal oxide semiconductor (MOS) structure has been investigated. MOS structure with Ge nanocrystals embedded in the oxide has been fabricated by using atom beam sputtering technique. After annealing at 600 °C in Ar + H2 atmosphere, capacitance-voltage (C-V) measurements show flat band voltage shift of â¼0.9 V. It which is a clear indication of the memory effect of Ge nanocrystals, while unannealed structure doesnot show any hysteresis in the C-V curve. Micro Raman spectroscopy and X-ray diffraction (XRD) analyses show that crystalline content of Ge nanoparticles in the MOS structure has increased after annealing.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 266, Issue 1, January 2008, Pages 63-66
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 266, Issue 1, January 2008, Pages 63-66
نویسندگان
Y. Batra, D. Kabiraj, D. Kanjilal,