کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1686783 | 1010622 | 2010 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Synchrotron micro-XRF study of metal inclusions distribution and variation in fused silica induced by ultraviolet laser pulses
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Metal inclusions play critical roles in laser-induced damage for large fused silica optics. Here, the spatial distribution of sodium, aluminum, iron and copper in as-prepared samples is analyzed by synchrotron based X-ray fluorescence spectrometry microprobe system at the BL15U1 beam line at the Shanghai Synchrotron Radiation Facility. The as-prepared fused silica samples are induced by 355 nm laser pulses with no, or low, or high fluences. The spatial resolution of the obtained elemental maps is up to 50 μm. Analysis of the elemental maps indicates that the distribution of metals has a close association with the laser fluence and pulses. The normalized fluorescence signal attenuation for metal inclusions corresponds to the laser fluence. The decrement of metals depends chiefly upon the fluence other than pulses of the incidence laser, which is most pronounced for iron and least for copper. The decrement is evident for high fluence laser irradiation, while the amount is negligible for low fluence laser irradiation. Among the four metals, iron concentration is suggested as the most destructive factor for optics lifetime, especially under high fluence irradiation. The quasi-periodic feature of elemental distribution is partly ascribed to laser intensity modulation induced by Fresnel diffraction.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issue 9, 1 May 2010, Pages 1502-1507
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 268, Issue 9, 1 May 2010, Pages 1502-1507
نویسندگان
C.H. Li, X. Ju, W.D. Wu, X.D. Jiang, J. Huang, W.G. Zheng, X.H. Yu,