کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1687311 | 1010652 | 2006 | 6 صفحه PDF | دانلود رایگان |

We have systematically studied the effect of swift heavy ion bombardment on surface morphologies of nanocrystalline ferrite thin films using atomic force microscopy (AFM) technique. From TRIM calculation, 150 MeV Ni11+ ions and 100 MeV Ag7+ ions have been selected to suffice the two irradiation conditions namely Se < Seth and Se ∼ Seth, respectively. Nanocrystalline films of Li0.5Mn0.1Fe2.4O4 have been grown on Si(1 0 0) substrate by using rf magnetron sputtering technique. Implementation of the first condition (150 MeV Ni11+ ions) resulted in irradiation induced growth in the grain volumes at the fluence of 2.5 × 1012 ions/cm2. The results of the second experimental condition (100 MeV Ag7+ ions) are entirely different showing deep ditches (holes) and channels on the surfaces. Online elastic recoil detection analysis (ERDA) has been performed to observe the effects on preferential loss of the elements in the films.
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 244, Issue 1, March 2006, Pages 34–39