Applications of parametric X-rays for X-ray diffraction analysis

Until now parametric X-rays (PXR) have not had practical applications because of the lack of a modern compact accelerator providing the required beam current and consequently high X-ray photon flux. PXR sources even with the intensities achievable at present may be applied to a number of X-ray reflectometry and diffractometry measurements which are important for the characterization of crystals and multi-layer nanostructures. In the paper we present some proposals for possible PXR applications for a number of X-ray measurements based on the smooth energy tuning, high monochromaticity and directed emission of this radiation. The theoretical background and numerical evaluations for PXR applications for determining ingredient concentration in a solid solution in the range of anomalous dispersion of the defect atoms, determination of the phase structure of a crystal, and selective PXR action in organic compounds, important for medical and biological research, are considered.